Photoemission Electron Microscopy
Ultrafast Dynamics

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Lawrence Berkeley National Laboratory

Advanced Light Source
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Andreas Scholl

a_scholl@lbl.gov
last update: 11/04/2009
Takamura, Y., R.V. Chopdekar, A. Scholl, A. Doran, J.A. Liddle, B. Harteneck, and Y. Suzuki, "Tuning Magnetic Domain Structure in Nanoscale La 0.7Sr 0.3MnO 3 Islands," Nano Letters 6(6), 1287-1291 (2006). (7.3.1.1)

Abstract

Hoink, V., M.D. Sacher, J. Schmalhorst, G. Reiss, D. Engel, T. Weis, and A. Ehresmann, "Thermal stability of magnetic nanostructures in ion-bombardment-modified exchange-bias systems," Physical Review B: Condensed Matter and Materials Physics 73(22), 224428-224432 (2006). (7.3.1.1)

Abstract

Li, L., A.P. Hitchcock, N. Robar, R. Cornelius, J.L. Brash, A. Scholl, and A. Doran, "X-ray Microscopy Studies of Protein Adsorption on a Phase-Segregated Polystyrene/Polymethyl Methacrylate Surface. 1. Concentration and Exposure-Time Dependence for Albumin Adsorption," Journal of Physical Chemistry B 110(33), 16763-16773 (2006). (7.3.1.1)

Abstract

Finazzi, M., A. Brambilla, P. Biagioni, J. Graf, G.-H. Gweon, A. Scholl, A. Lanzara, and L. Duo, "Interface Coupling Transition in a Thin Epitaxial Antiferromagnetic Film Interacting with a Ferromagnetic Substrate," Physical Review Letters 97(9), 097202-1-097202-4 (2006). (7.3.1.1)

Abstract

Zhao, T., A. Scholl, F. Zavaliche, K. Lee, M. Barry, A. Doran, M.P. Cruz, Y.H. Chu, C. Ederer, N.A. Spaldin, R.R. Das, D.M. Kim, S.H. Baek, C.B. Eom, and R. Ramesh, "Electrical control of antiferromagnetic domains in multiferroic BiFeO3 films at room temperature," Nature Materials 5(10), 823-829 (2006). (7.3.1.1)

Abstract

Huetten, A., J. Schmalhorst, A. Thomas, S. Kammerer, M. Sacher, D. Ebke, N.-N. Liu, X. Kou, and G. Reiss, "Spin-electronic devices with half-metallic Heusler alloys," Journal of Alloys and Compounds 423(1-2), 148-152 (2006). (7.3.1.1)

Abstract

Schmalhorst, J., M.D. Sacher, V. Hoink, G. Reiss, A. Hutten, D. Engel, and A. Ehresmann, "Magnetic and chemical properties of Co{d2}MnSi thin films compared to the Co{d2}MnSi/Al-O interface," Journal of Applied Physics 100, 113903 (December 2006). (7.3.1)

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