Photoemission Electron Microscopy

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Lawrence Berkeley National Laboratory

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Andreas Scholl

a_scholl@lbl.gov
last update: 01/6/2015

Beamline 11.0.1

Source
5.0-cm-period elliptical polarization undulator (EPU5)
Monochromator VLS-PGM
Energy range
160–1800 eV
Energy resolution E/DE
4,000 at 800 eV
Polarization
Polarization is user selectable; linear polarization continuously variable from horizontal to vertical; left and right elliptical (or circular) polarization

Endstation 1: PEEM-3

Endstation Photoemission electron microscope (PEEM3) 11.0.1.1
Detectors Slow scan CCD, fast APD point detector
Characteristics

X-ray absorption spectromicroscopy

Spatial resolution Better than 50 nm depending on sample
Spot size at sample Adjustable down to 10 x 10 µm
Sample format UHV-compatible, flat, conductive samples up to 20 mm x 20 mm in area
Sample preparation Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability
Sample environment UHV, sample heating (800 K) and cooling (30 K), current pulses down to 2 ns
Scientific applications Real-time and pump-probe study of elemental, chemical, magnetic, and topographical properties of materials