Beamline 12.3.2 provides
for the rapid collection of x-ray diffraction data with
extremely high spatial resolution.
The capabilities of the beamline include:
- High resolution mapping of:
- Grain orientation and structure
- Triaxial stress and strain
- Plastic deformation
- Phase distribution in
heterogeneous samples
- Simultaneous collection of x-ray
fluorescence data
- Rapid data collection via CCD
detector
- In-situ probing of sample
during heating, cooling, etc.
Beamline 12.3.2
characteristics:
- Elliptically bent ultrasmooth mirrors in a Kirkpatrick-Baez
configuration provide micron to submicron x-ray spot size on the
sample.
- High x-ray flux provided by synchrotron superconducting
magnet source.
- Mirrors provide achromatic focusing, allowing the use of
white x-ray beam (5-22 keV) for Laue diffraction.
- A 4-crystal Si(111) monochromator allows switching between
white and monochromatic radiation while illuminating the same
area of the sample.
- A high precision XY positioning stage allows scanning of
the sample under the microbeam and collecting diffraction data
at each step (Scanning x-ray microdiffraction).
- A MAR CCD detector provides collection of diffraction data
from a large solid angle.
- Custom in-house software suite allows for automated data
collection and analysis.
Schematic layout of Beamline 7.3.3 at the
Advanced Light Source. |
